Scanning Electron Microscopy
Scanning Electron Microscopy
Brand
Springer Nature
Manufacturer
N/A
Part Number
0
GTIN
9783540639763
Condition
New
Product Description
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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