X-Ray Diffraction by Disordered Lamellar Structures
X-Ray Diffraction by Disordered Lamellar Structures
Brand
Springer Nature
Manufacturer
N/A
Part Number
0
GTIN
9783642748028
Condition
New
Product Description
New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.
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