Test Generation of Crosstalk Delay Faults in VLSI Circuits

Name: Test Generation of Crosstalk Delay Faults in VLSI Circuits
Brand: Springer Nature
SKU: 9789811324932
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Springer Nature

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9789811324932

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Product Description

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

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