Test Generation of Crosstalk Delay Faults in VLSI Circuits

Name: Test Generation of Crosstalk Delay Faults in VLSI Circuits
Brand: Springer Nature
SKU: 9789811324932
Availability: InStock

Best Price (Coupon Required):
Buy Test Generation of Crosstalk Delay Faults in VLSI Circuits for $107.10 at @ Link.springer.com when you apply the 10% OFF coupon at checkout.
Click “Get Coupon & Buy” to copy the code and unlock the deal.

Set a price drop alert to never miss an offer.

1 Offer Price Range: $119.00 - $119.00

BEST PRICE

Single Product Purchase

$107.10

@ Link.springer.com with extra coupon

Price Comparison

Seller	Contact Seller	List Price	On Sale	Shipping	Best Promo	Final Price	Volume Discount	Financing	Availability	Seller's Page
BEST PRICE 1 Product Purchase @ Link.springer.com		$119.00	$119.00		10% OFF This deals requires coupon	$107.10		See Site	In stock	Visit Store

Product Details

Brand

Springer Nature

Manufacturer

N/A

Part Number

GTIN

9789811324932

Condition

New

Product Description

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

Available Colors

N/A

Available Sizes

N/A