High-Resolution X-Ray Scattering from Thin Films and Multilayers
High-Resolution X-Ray Scattering from Thin Films and Multilayers
Brand
Springer Nature
Manufacturer
N/A
Part Number
0
GTIN
9783540496250
Condition
New
Product Description
This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.
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