High-Resolution X-Ray Scattering from Thin Films and Multilayers

Name: High-Resolution X-Ray Scattering from Thin Films and Multilayers
Brand: Springer Nature
SKU: 9783540496250
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Springer Nature

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9783540496250

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Product Description

This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.

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