Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching

Name: Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Brand: Springer Nature
SKU: 9783540284055
Availability: InStock

Best Price (Coupon Required):
Buy Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching for $152.10 at @ Link.springer.com when you apply the 10% OFF coupon at checkout.
Click “Get Coupon & Buy” to copy the code and unlock the deal.

Set a price drop alert to never miss an offer.

1 Offer Price Range: $169.00 - $169.00

BEST PRICE

Single Product Purchase

$152.10

@ Link.springer.com with extra coupon

Price Comparison

Seller	Contact Seller	List Price	On Sale	Shipping	Best Promo	Final Price	Volume Discount	Financing	Availability	Seller's Page
BEST PRICE 1 Product Purchase @ Link.springer.com		$169.00	$169.00		10% OFF This deals requires coupon	$152.10		See Site	In stock	Visit Store

Product Details

Brand

Springer Nature

Manufacturer

N/A

Part Number

GTIN

9783540284055

Condition

New

Product Description

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.

Available Colors

N/A

Available Sizes

N/A