Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

Name: Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
Brand: Springer Nature
SKU: 9783030683689
Availability: InStock

Best Price (Coupon Required):
Buy Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs for $54.00 at @ Link.springer.com when you apply the 10% OFF coupon at checkout.
Click “Get Coupon & Buy” to copy the code and unlock the deal.

Set a price drop alert to never miss an offer.

1 Offer Price Range: $59.99 - $59.99

BEST PRICE

Single Product Purchase

$54.00

@ Link.springer.com with extra coupon

Price Comparison

Seller	Contact Seller	List Price	On Sale	Shipping	Best Promo	Final Price	Volume Discount	Financing	Availability	Seller's Page
BEST PRICE 1 Product Purchase @ Link.springer.com		$59.99	$59.99		10% OFF This deals requires coupon	$54.00		See Site	In stock	Visit Store

Product Details

Brand

Springer Nature

Manufacturer

N/A

Part Number

GTIN

9783030683689

Condition

New

Product Description

This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical properties of devices. The authors also explore four circuit-level techniques (e.g. transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells. This book also evaluates the mitigation tendency when different levels of process variation, transistor sizing, and radiation particle characteristics are applied in the design. An overall comparison of all methods addressed by this work is provided allowing to trace a trade-off between the reliability gains and the design penalties of each approach regardingthe area, performance, power consumption, single event transient (SET) pulse width, and SET cross-section.

Available Colors

N/A

Available Sizes

N/A